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Dec 10

Deep Open-Set Recognition for Silicon Wafer Production Monitoring

The chips contained in any electronic device are manufactured over circular silicon wafers, which are monitored by inspection machines at different production stages. Inspection machines detect and locate any defect within the wafer and return a Wafer Defect Map (WDM), i.e., a list of the coordinates where defects lie, which can be considered a huge, sparse, and binary image. In normal conditions, wafers exhibit a small number of randomly distributed defects, while defects grouped in specific patterns might indicate known or novel categories of failures in the production line. Needless to say, a primary concern of semiconductor industries is to identify these patterns and intervene as soon as possible to restore normal production conditions. Here we address WDM monitoring as an open-set recognition problem to accurately classify WDM in known categories and promptly detect novel patterns. In particular, we propose a comprehensive pipeline for wafer monitoring based on a Submanifold Sparse Convolutional Network, a deep architecture designed to process sparse data at an arbitrary resolution, which is trained on the known classes. To detect novelties, we define an outlier detector based on a Gaussian Mixture Model fitted on the latent representation of the classifier. Our experiments on a real dataset of WDMs show that directly processing full-resolution WDMs by Submanifold Sparse Convolutions yields superior classification performance on known classes than traditional Convolutional Neural Networks, which require a preliminary binning to reduce the size of the binary images representing WDMs. Moreover, our solution outperforms state-of-the-art open-set recognition solutions in detecting novelties.

  • 5 authors
·
Aug 30, 2022

TI-PREGO: Chain of Thought and In-Context Learning for Online Mistake Detection in PRocedural EGOcentric Videos

Identifying procedural errors online from egocentric videos is a critical yet challenging task across various domains, including manufacturing, healthcare, and skill-based training. The nature of such mistakes is inherently open-set, as unforeseen or novel errors may occur, necessitating robust detection systems that do not rely on prior examples of failure. Currently, however, no technique effectively detects open-set procedural mistakes online. We propose a dual branch architecture to address this problem in an online fashion: one branch continuously performs step recognition from the input egocentric video, while the other anticipates future steps based on the recognition module's output. Mistakes are detected as mismatches between the currently recognized action and the action predicted by the anticipation module. The recognition branch takes input frames, predicts the current action, and aggregates frame-level results into action tokens. The anticipation branch, specifically, leverages the solid pattern-matching capabilities of Large Language Models (LLMs) to predict action tokens based on previously predicted ones. Given the online nature of the task, we also thoroughly benchmark the difficulties associated with per-frame evaluations, particularly the need for accurate and timely predictions in dynamic online scenarios. Extensive experiments on two procedural datasets demonstrate the challenges and opportunities of leveraging a dual-branch architecture for mistake detection, showcasing the effectiveness of our proposed approach. In a thorough evaluation including recognition and anticipation variants and state-of-the-art models, our method reveals its robustness and effectiveness in online applications.

  • 9 authors
·
Nov 4, 2024